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| Artikelnummer: | SN74BCT8374ADWR |
|---|---|
| Hersteller / Marke: | Texas Instruments |
| Teil der Beschreibung.: | IC SCAN TEST DEVICE W/FF 24-SOIC |
| Datenblätte: |
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| RoHs Status: | |
| Zahlungsmittel: | PayPal / Credit Card / T/T |
| Versandweg: | DHL / Fedex / TNT / UPS / EMS |
| Aktie: |
Ship From: Hong Kong
Online -RFQ -Einreichungen: Schnelle Antworten, bessere Preise!
| Produkteigenschaften | Eigenschaften |
|---|---|
| Versorgungsspannung | 4.5V ~ 5.5V |
| Supplier Device-Gehäuse | 24-SOIC |
| Serie | 74BCT |
| Verpackung / Gehäuse | 24-SOIC (0.295", 7.50mm Width) |
| Paket | Tape & Reel (TR) |
| Betriebstemperatur | 0°C ~ 70°C |
| Produkteigenschaften | Eigenschaften |
|---|---|
| Anzahl der Bits | 8 |
| Befestigungsart | Surface Mount |
| Logiktyp | Scan Test Device with D-Type Edge-Triggered Flip-Flops |
| Grundproduktnummer | 74BCT8374 |
| SN74BCT8374ADWR Einzelheiten PDF [English] | SN74BCT8374ADWR PDF - EN.pdf |




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