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| Artikelnummer: | 5962-9172701QLA |
|---|---|
| Hersteller / Marke: | Texas Instruments |
| Teil der Beschreibung.: | SN54BCT8374A SCAN TEST DEVICES W |
| Datenblätte: | None |
| RoHs Status: | Lead free / RoHs compliant |
| Zahlungsmittel: | PayPal / Credit Card / T/T |
| Versandweg: | DHL / Fedex / TNT / UPS / EMS |
| Aktie: |
Ship From: Hong Kong
| Anzahl | Einzelpreis |
|---|---|
| 1+ | $58.5412 |
| 200+ | $22.6556 |
| 500+ | $21.8595 |
| 1000+ | $21.4651 |
Online -RFQ -Einreichungen: Schnelle Antworten, bessere Preise!
| Produkteigenschaften | Eigenschaften |
|---|---|
| Serie | * |
| Paket | Bulk |
| Produkteigenschaften | Eigenschaften |
|---|---|
| Grundproduktnummer | 5962-9172701 |




MILITARY 8-CH, 4.5-V TO 5.5-V BI
12-BIT ADC (AD74BTE)
SCAN TEST DEVICES WITH OCTAL BUF
MILITARY 8-CH, 4.5-V TO 5.5-V BI
NVSRAM - DUAL MARKED (22V10)
SN54BCT8244A SCAN TEST DEVICES W
SN54BCT8245A SCAN TEST DEVICES W
SN54BCT8373A SCAN TEST DEVICES W
SCAN TEST DEVICES WITH OCTAL BUF
IC PROM 256KBIT PARALLEL 28CDIP
8-BIT MCU, OTPROM, 8051 CPU
LOGARITHMIC AMPLIFIER 16-CDIP -5
8-BIT MCU, OTPROM, 8051 CPU
SCAN TEST DEVICES WITH OCTAL D-T
IC ADC 12BIT SAR 28LCC
SN54BCT8245A SCAN TEST DEVICES W
SN54BCT8374A SCAN TEST DEVICES W
DUAL MARKED (TLC7705M)
IC ADC 12BIT SAR 28CDIP
SCAN TEST DEVICES WITH OCTAL BUF
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5962-9172701QLATexas Instruments |
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